A six-port reflectometer for in-situ monitoring of frequency multipliers
Guoguang Wu(Jilin University), Robert M. Weikle(Microprobes (United States)), Arthur W. Lichtenberger(University of Virginia), Jeffrey L. Hesler(Virginia Diodes (United States)), Haiyong Xu(University of Virginia)
Cited by 0
Related Papers
Crossover from incoherent to coherent phonon scattering in epitaxial oxide superlattices
|Nature Materials|2013|510
A Broadband Quasi-Optical Terahertz Detector Utilizing a Zero Bias Schottky Diode
|IEEE Microwave and Wireless Components Letters|2010|156
Micromachined Probes for Submillimeter-Wave On-Wafer Measurements—Part I: Mechanical Design and Characterization
|IEEE Transactions on Terahertz Science and Technology|2011|85
Development of the ALMA Band-3 and Band-6 Sideband-Separating SIS Mixers
|IEEE Transactions on Terahertz Science and Technology|2014|66
Micromachined Probes for Submillimeter-Wave On-Wafer Measurements—Part II: RF Design and Characterization
|IEEE Transactions on Terahertz Science and Technology|2011|58