Localizing power to ground shorts in a chips-first MCM by scanning SQUID microscopy
William E. Vanderlinde(Cornell University), Hans M. Christen(Neocera (United States)), B. M. Frazier(Neocera (United States)), K.L. Skinner, L.A. Knauss(Neocera (United States)), M. E. Cheney, E. B. McDaniel(University of Virginia)
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