Ion Beam Preparation Procedures for Three-dimensional SEM Resolved Kikuchi (EBSD) and Kossel Microdiffraction Analysis of Deformed Metals

W. Hauffe(Technische Universität Dresden), R J Mitro, Enrico Langer(Technische Universität Dresden), Karsten Kunze(Brigham Young University), Gerd Simons(ETH Zurich)
Microscopy and Microanalysis
August 1, 2005
Cited by 0


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