Lattice constant determination from Kossel patterns observed by CCD cameraEnrico Langer, W. Hauffe, S. Däbritz et al.|Applied Surface Science|2001Cited by 21
Kossel and pseudo Kossel CCD pattern in comparison with electron backscattering diffraction diagramsS. Däbritz, W. Hauffe, Enrico Langer|Applied Surface Science|2001Cited by 17
Advances in X-ray excitation of Kossel patterns by a focusing polycapillary lensEnrico Langer, Michael Haschke, W. Hauffe et al.|Applied Surface Science|2005Cited by 14
New observation method for divergent beam X-ray diffraction patternsS. Däbritz, W. Hauffe, Enrico Langer|Journal of Analytical Atomic Spectrometry|1999Cited by 12
Studies of polycrystalline materials by Pseudo Kossel techniqueEnrico Langer, W. Hauffe, S. Däbritz et al.|Fresenius Journal of Analytical Chemistry|1999Cited by 5