How is it possible to obtain buried interface information through very thick films using a hard-X-ray PEEM?
T. Kinoshita(Tohoku University), C. Kunz(Universität Hamburg), A. Ino(Hiroshima University), James Harries(SPring-8), W. Drube(Deutsches Elektronen-Synchrotron DESY), Tetsuya Ishikawa(Naruto University of Education), K. Shimada(Hiroshima University), Shigenori Ueda(National Institute for Materials Science), Kenji Tamasaku(SPring-8), Keisuke Kobayashi(National Institute for Materials Science), Yoshinori Nishino(Osaka Nishi Clinic), Eiji Ikenaga(SPring-8), Masaaki Kobata(Japan Science and Technology Agency)
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