Magnetism, microstructure, and photoelectron spectroscopy of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mi mathvariant="normal">Nd</mml:mi><mml:mn>0.7</mml:mn></mml:msub><mml:msub><mml:mi mathvariant="normal">Ce</mml:mi><mml:mn>0.3</mml:mn></mml:msub><mml:mi mathvariant="normal">Mn</mml:mi><mml:msub><mml:mi mathvariant="normal">O</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math>thin filmsTakeshi Yanagida, Keisuke Kobayashi, Hidekazu Tanaka et al.|Physical Review B|2006Cited by 17
How is it possible to obtain buried interface information through very thick films using a hard-X-ray PEEM?T. Kinoshita, C. Kunz, James Harries et al.|Surface Science|2007Cited by 10