Leakage currents in Ba0.7Sr0.3TiO3 thin films for ultrahigh-density dynamic random access memories

G. Dietz(RWTH Aachen University), A. I. Kingon(North Carolina State University), C. Basceri(North Carolina State University), Rainer Waser(X-Fab (Germany)), S. K. Streiffer(Argonne National Laboratory), M. Schumacher(RWTH Aachen University)
Journal of Applied Physics
September 1, 1997
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