Study of electronic states for V thin films deposited on 6H-SiC substrates by soft X-ray emission spectroscopy
Masaaki Hirai(Okayama University), T. Yokoya(The University of Tokyo), R. Yoshida(Okayama University), Hiroyuki Okazaki(Okayama University), Kyosuke Saeki(Ehime Prefectural Central Hospital), Yuji Muraoka(Okayama University of Science), Mitsutoshi Tajima(Okayama University)
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