Transmission electron microscopy observation of deformation microstructure under spherical indentation in silicon
J. E. Bradby(Australian National University), Paul Munroe(UNSW Sydney), Michael V. Swain(The University of Sydney), J. Wong‐Leung(Australian National University), J. S. Williams(University of Illinois Urbana-Champaign)
Cited by 226
Related Papers
Electron-pinned defect-dipoles for high-performance colossal permittivity materials
|Nature Materials|2013|1.1k
An investigation into the reactions of biochar in soil
|Soil Research|2010|1.1k
Strength, fracture toughness and microstructure of a selection of all-ceramic materials. Part II. Zirconia-based dental ceramics
|Dental Materials|2003|895
Microfracture beneath point indentations in brittle solids
|Journal of Materials Science|1975|725
A simple predictive model for spherical indentation
|Journal of materials research/Pratt's guide to venture capital sources|1993|682