Investigation of structural and electronic properties of graphene oxide

Abstract

The local atomic structure of graphene oxide has been probed using synchrotron radiations. Detailed investigations of recently proposed simplistic model of graphene oxide using x-ray absorption near edge spectroscopy have been performed. X-ray diffraction measurements and calculations indicate loss of coherence between graphene-like layers. However, larger in-plane structural coherence is understood to be present. Selected area electron diffraction measurements indicate the presence of graphitic regions in graphene oxide which is expected to produce interesting confinement effects in graphene oxide which could be important for the development of tunable electronic and photonic devices.