Broadband Characterization of Multilayer Dielectric Thin-Films
Nathan D. Orloff(National Institute of Standards and Technology), James C. Booth(National Institute of Standards and Technology), Makoto Murakami(Tohoku University), Ichiro Takeuchi(University of Maryland, College Park), Jordi Mateu(National Institute of Standards and Technology)
Cited by 17
Related Papers
Room-Temperature Ferromagnetism in Transparent Transition Metal-Doped Titanium Dioxide
|Science|2001|2.5k
High throughput fabrication of transition-metal-doped epitaxial ZnO thin films: A series of oxide-diluted magnetic semiconductors and their properties
|Applied Physics Letters|2001|597
Covalency-reinforced oxygen evolution reaction catalyst
|Nature Communications|2015|542
Combinatorial solid-state chemistry of inorganic materials
|Nature Materials|2004|476