Layout Characterization and Power Density Analysis for Shorted-Gate and Independent-Gate 7nm FinFET Standard Cells

Tiansong Cui(University of Southern California), Massoud Pedram(University of Southern California), Shahin Nazarian(University of Southern California), Yanzhi Wang(Sichuan University), Bowen Chen(State Key Laboratory of Chemical Engineering)
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May 19, 2015
Cited by 5


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