Quantitative analysis of Si mass transport during formation of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mi mathvariant="normal">Cu</mml:mi><mml:mo>∕</mml:mo><mml:mi mathvariant="normal">Si</mml:mi><mml:mrow><mml:mo>(</mml:mo><mml:mn>111</mml:mn><mml:mo>)</mml:mo></mml:mrow><mml:mtext>−</mml:mtext><mml:mrow><mml:mo>(</mml:mo><mml:mn>5</mml:mn><mml:mo>×</mml:mo><mml:mn>5</mml:mn><mml:mo>)</mml:mo></mml:mrow></mml:mrow></mml:math>from scanning tunneling microscopy
Y. P. Zhang(National University of Singapore), Andrew T. S. Wee(National University of Singapore), Xuesen Wang(National University of Singapore), Guo Qin Xu(Chongqing University), Shuting Chen(National University of Singapore), H. S. O. Chan(National University of Singapore), Kian Soon Yong(National University of Singapore)
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