Non-volatile memory based on the ferroelectric photovoltaic effect

Rui Guo(Nanyang Technological University), Lü You(Nanyang Technological University), Zhou Yang(Nanyang Technological University), Zhi Shiuh Lim(Nanyang Technological University), Xi Zou(Nanyang Technological University), Lang Chen(Nanyang Technological University), R. Ramesh(University of California, Berkeley), Junling Wang(Nanyang Technological University)
Nature Communications
June 11, 2013
Cited by 494Open Access
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Abstract

The quest for a solid state universal memory with high-storage density, high read/write speed, random access and non-volatility has triggered intense research into new materials and novel device architectures. Though the non-volatile memory market is dominated by flash memory now, it has very low operation speed with ~10 μs programming and ~10 ms erasing time. Furthermore, it can only withstand ~105 rewriting cycles, which prevents it from becoming the universal memory. Here we demonstrate that the significant photovoltaic effect of a ferroelectric material, such as BiFeO3 with a band gap in the visible range, can be used to sense the polarization direction non-destructively in a ferroelectric memory. A prototype 16-cell memory based on the cross-bar architecture has been prepared and tested, demonstrating the feasibility of this technique. Ferroelectric RAM is considered a promising candidate on the quest for a universal memory, but the concept is still problem prone. Here, the authors use the ferroelectric photovoltaic effect as a non-destructive read-out method for a new prototype memory, which shows good data retention and fatigue resistance.


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