Metamorphic buffers and optical measurement of residual strain
M. Geddo(University of Parma), S. Franchi(Institute of Materials for Electronics and Magnetism), G. Guizzetti(University of Pavia), L. Seravalli(Institute of Materials for Electronics and Magnetism), M. Patrini(University of Pavia), P. Frigeri(Institute of Materials for Electronics and Magnetism), T. Ciabattoni(University of Pavia)
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