High-Accuracy Lattice Constant Measurements of Electron-Irradiated 6H-SiC Single Crystals
Christoph Seitz(Friedrich-Alexander-Universität Erlangen-Nürnberg), Hans Schaefer(University of Stuttgart), Wolfgang Sprengel(Graz University of Technology), A. Magerl, M. Gomm(Friedrich-Alexander-Universität Erlangen-Nürnberg), Al. Rempel(University of Stuttgart)
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