Imaging the life story of nanotube devices

Thomas D. Yuzvinsky(Lawrence Berkeley National Laboratory), William Mickelson(Lawrence Berkeley National Laboratory), Shaul Aloni(Lawrence Berkeley National Laboratory), S. L. Konsek(Lawrence Berkeley National Laboratory), Adam Fennimore(Lawrence Berkeley National Laboratory), G. E. Begtrup(Lawrence Berkeley National Laboratory), András Kis(Lawrence Berkeley National Laboratory), B. C. Regan(Lawrence Berkeley National Laboratory), Alex Zettl(Lawrence Berkeley National Laboratory)
Applied Physics Letters
August 12, 2005
10.1063/1.2012529
Cited by 52Open Access
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Abstract

Live imaging of operating multiwall carbon nanotube (MWCNT-) based electronic devices is performed by high resolution transmission electron microscopy. Our measurements allow us to correlate electronic transport with changes in device structure. Surface contamination, contact annealing, and sequential wall removal are observed. Temperature profiles confirm diffusive conduction in MWCNTs in the high bias limit. This technique provides a general platform for studying nanoscale systems, where geometric configuration and electronic transport are intimately connected.

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