Sample preparation for nanoanalytical electron microscopy using the FIB lift-out method and low energy ion milling

J. Scott(University of Glasgow), A. J. Craven(University of Glasgow), Brian W. Miller(University of Glasgow), F.T. Docherty(Imperial College London), Courtney L. Collins(University of Glasgow), William Smith(University of Glasgow), Mhairi Mackenzie(Urban Big Data Centre)
Journal of Physics Conference Series
February 22, 2006
Cited by 18


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