Critical thickness of high structural quality SrTiO3 films grown on orthorhombic (101) DyScO3
Michael D. Biegalski(Oak Ridge National Laboratory), Darrell G. Schlom(Cornell University), Susan Trolier‐McKinstry(Pennsylvania State University), M. Bernhagen, P. H. Fuoss(Argonne National Laboratory), J. Schubert(Forschungszentrum Jülich), D. D. Fong(Argonne National Laboratory), Wei Tian(University of Michigan), S. K. Streiffer(Argonne National Laboratory), T. Heeg(Forschungszentrum Jülich), R. Uecker(Leibniz Institute for Crystal Growth), C.T. Nelson(University of Michigan), P. Reiche(Leibniz Institute for Crystal Growth), Xiaoqing Pan(University of California, Irvine), M. E. Hawley(Los Alamos National Laboratory), J. A. Eastman(Northern Illinois University)
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