Leakage power reduction for deeply-scaled FinFET circuits operating in multiple voltage regimes using fine-grained gate-length biasing technique

Ji Li(University of Southern California), Massoud Pedram(University of Southern California), Shahin Nazarian(University of Southern California), Yanzhi Wang(Sichuan University), Qing Xie(University of Southern California)
Design, Automation, and Test in Europe
March 9, 2015
10.5555/2755753.2757177
Cited by 7

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