Interpretation of near-band-edge photoreflectance spectra from CdTe
Zhonghai Yu(Ministry of Education), Christopher J. Summers(West Virginia University), Simon Hofer(West Virginia University), N. C. Giles(West Virginia University), T. H. Myers(Texas State University)
Cited by 23
Related Papers
Realization of BaZrS3 chalcogenide perovskite thin films for optoelectronics
|Nano Energy|2019|191
Absorption Coefficient and Refractive Index of GaN, AlN and AlGaN Alloys
|MRS Internet Journal of Nitride Semiconductor Research|1999|171
Chalcogenide perovskite BaZrS3 thin-film electronic and optoelectronic devices by low temperature processing
|Nano Energy|2021|119
(Bi0.5Na0.5)TiO3-based relaxor ferroelectrics with medium permittivity featuring enhanced energy-storage density and excellent thermal stability
|Chemical Engineering Journal|2021|110
Large energy storage properties of lead-free (1-x)(0.72Bi0.5Na0.5TiO3-0.28SrTiO3)-xBiAlO3 ceramics at broad temperature range
|Journal of Alloys and Compounds|2019|92