18.2 nm Schwarzschild microscope for diagnostics of hot electron transport
Xin Wang(Tongji University), Pengfei He(Tongji University), Yuqiu Gu(China Academy of Engineering Physics), Hongjie Liu(Laser Research Institute), Jingtao Zhu(Tongji University), Zhanshan Wang(Tongji University), Shengzhen Yi(Tongji University), Baozhong Mu(Tongji University), Yi Huang(Tongji University), Li Jiang(Tongji University), Leifeng Cao(Laser Research Institute)
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