Scanning Tunnelling Microscope Tip-Induced Reconstruction on Si(111) (3) <sup>1/2</sup> ×(3) <sup>1/2</sup> R30°-Ag Surface
Bin Li(Guizhou University), Hou Jian-Guo(University of Science and Technology of China), Changgan Zeng(University of Science and Technology of China), Bing Wang(University of Science and Technology of China), Haiqian Wang(University of Science and Technology of China)
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