Effect of an in-Situ H2 Plasma Pretreatment on the Minority Carrier lifetime of a-Si:H(i) Passivated Crystalline Silicon
S.N. Granata(IMEC), Robert Mertens(Humboldt-Universität zu Berlin), Frédéric Dross(Imec the Netherlands), I. Gordon(Imec the Netherlands), Twan Bearda(IMEC), J. Poortmans(IMEC)
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