Photoreflectance versus ellipsometry investigation of GaAs/Al0.3Ga0.7As MQW's
V. Bellani(University of Pavia), Chenjia Chen(Istituto Nazionale di Fisica Nucleare, Sezione di Pavia), G. Guizzetti(University of Pavia), A. Borghesi(Inserm), M. Geddo(University of Parma), A. Stella(Istituto Nazionale di Fisica Nucleare, Sezione di Pavia)
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