Measurement of the electrostatic edge effect in wurtzite GaN nanowires
Alex Henning(Schott (Germany)), Y. Rosenwaks(Afeka College of Engineering), Norman A. Sanford(Physical Measurement Laboratory), Kris A. Bertness(Physical Measurement Laboratory), Benjamin Klein(Kennesaw State University), Paul T. Blanchard(Physical Measurement Laboratory)
Cited by 13
Related Papers
A Dynamic Convolutional Layer for short rangeweather prediction
|Unknown|2015|178
Comparison of optical VCSEL models on the simulation of oxide-confined devices
|IEEE Journal of Quantum Electronics|2001|94
Temperature Dependence of the Piezotronic Effect in ZnO Nanowires
|Nano Letters|2013|86
WHY HOLD‐UPS OCCUR: THE SELF‐ENFORCING RANGE OF CONTRACTUAL RELATIONSHIPS
|Economic Inquiry|1996|81
Theoretical Study of Piezo‐phototronic Nano‐LEDs
|Advanced Materials|2014|74