<title>Characterization of polycrystalline phosphors for area x-ray detectors</title>
Sol M. Grüner(Cornell University), Eric F. Eikenberry(Paul Scherrer Institute), Sandor L. Barna, Mark W. Täte, Michael E. Wall(Los Alamos National Laboratory)
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
December 16, 1993
Cited by 18
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