Hard-X-ray dark-field imaging using a grating interferometer
Franz Pfeiffer(Technical University of Munich), Christophe David(Iowa State University), Eric F. Eikenberry(Paul Scherrer Institute), Martin Bech(University of Copenhagen), C. Grünzweig(Paul Scherrer Institute), Oliver Bunk(Paul Scherrer Institute), Ch. Brönnimann(Paul Scherrer Institute), Philipp Kraft(Paul Scherrer Institute)
Cited by 1,134
Related Papers
Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources
|Nature Physics|2006|1.8k
High-Resolution Scanning X-ray Diffraction Microscopy
|Science|2008|1.3k
X-ray phase imaging with a grating interferometer
|Optics Express|2005|1.2k
Ptychographic X-ray computed tomography at the nanoscale
|Nature|2010|916
Hard-X-Ray Lensless Imaging of Extended Objects
|Physical Review Letters|2007|846