Characterization and aluminum metallization of a parylene AF-4 surface
Ronald Sutcliffe(Texas Instruments (United States)), W.W Lee(Texas Instruments (United States)), Justin F. Gaynor(Texas Instruments (United States)), J. D. Luttmer(Texas Instruments (United States)), D. Martini(University of North Texas), J. A. Kelber(University of North Texas), M. A. Plano(Micro Focus (United States))
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