Inverse geometry for grating-based x-ray phase-contrast imaging

Abstract

Phase-contrast imaging using conventional polychromatic x-ray sources and grating interferometers has been developed and demonstrated for x-ray energies up to 60 keV. Here, we conduct an analysis of possible grating configurations for this technique and present further geometrical arrangements not considered so far. An inverse interferometer geometry is investigated that offers significant advantages for grating fabrication and for the application of the method in computed tomography (CT) scanners. We derive and measure the interferometer’s angular sensitivity for both the inverse and the conventional configuration as a function of the sample position. Thereby, we show that both arrangements are equally sensitive and that the highest sensitivity is obtained, when the investigated object is close to the interferometer’s phase grating. We also discuss the question whether the sample should be placed in front of or behind the phase grating. For CT applications, we propose an inverse geometry with the sample position behind the phase grating.