Universal conductance fluctuations in silicon inversion-layer nanostructures

W. J. Skocpol(TKL Research), A. Douglas Stone(Yale University), D. M. Tennant(University of Tennessee at Knoxville), P. M. Mankiewich(AT&T (United States)), L. D. Jackel(AT&T (United States)), Richard Howard(Samsung (United States))

Physical Review Letters

June 30, 1986

10.1103/physrevlett.56.2865

Cited by 259

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