Investigation of the microstructure of IrSi X thin films

R. Kurt(Leibniz Institute for Solid State and Materials Research), K. Wetzig(Leibniz Institute for Solid State and Materials Research), J. Thomas(University of Calicut), H. Wendrock(Leibniz Institute for Solid State and Materials Research), W. Brückner(Leibniz Institute for Solid State and Materials Research), W. Pitschke(Leibniz Institute for Solid State and Materials Research)
Fresenius Journal of Analytical Chemistry
August 3, 1998
Cited by 3


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