Study of Multi-level Characteristics for 3D Vertical Resistive Switching Memory

Yue Bai(Beijing Microelectronics Technology Institute), He Qian(University of Science and Technology of China), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Ning Deng(Fujitsu (China)), Ye Zhang(Beijing Microelectronics Technology Institute), Zhiping Yu(Beijing Microelectronics Technology Institute), Riga Wu(Inner Mongolia University)
Scientific Reports
July 22, 2014
10.1038/srep05780
Cited by 123

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