Structural Characterization of Three Crystalline Modifications of Telmisartan by Single Crystal and High‐Resolution X‐ray Powder Diffraction

Robert E. Dinnebier(Max Planck Institute for Solid State Research), William I. F. David(Science and Technology Facilities Council), Peter Sieger(Boehringer Ingelheim (Germany)), Herbert Nar(Boehringer Ingelheim (Germany)), Kenneth Shankland(University of Reading)
Journal of Pharmaceutical Sciences
November 1, 2000
Cited by 68


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