Degradation of Charge Collection Efficiency for 6H-SiC Diodes by Electron Irradiation
Naoya Iwamoto(National Institutes for Quantum Science and Technology), Katsuyasu Kawano(University of Electro-Communications), Makoto Murakami(Tohoku University), Takeshi Ohshima, I. Nakano(University of Tsukuba), Shinobu Onoda(National Institutes for Quantum Science and Technology), Shigeomi Hishiki(Japan Atomic Energy Agency)
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