Direct structural determination in ultrathin ferroelectric films by analysis of synchrotron x-ray scattering measurements
Dillon D. Fong(Northern Illinois University), Edward A. Stern(University of Washington), Carol Thompson(Northern Illinois University), P. H. Fuoss(Northern Illinois University), J. A. Eastman(Northern Illinois University), Y. Yacoby(Hebrew University of Jerusalem), Roy Clarke(University of Illinois Chicago), G. B. Stephenson(Massachusetts Institute of Technology), R. Pindak(Brookhaven National Laboratory), S. K. Streiffer(Argonne National Laboratory), Codrin Cionca(University of Michigan)
Cited by 113
Related Papers
Room-temperature ferroelectricity in strained SrTiO3
|Nature|2004|2.1k
Ferroelectric thin films: Review of materials, properties, and applications
|Journal of Applied Physics|2006|1.9k
Ferroelectricity in Ultrathin Perovskite Films
|Science|2004|1.3k
Strain Tuning of Ferroelectric Thin Films
|Annual Review of Materials Research|2007|1.1k
Strongly correlated perovskite fuel cells
|Nature|2016|542