Impact of the Mechanical Stress on Switching Characteristics of Electrochemical Resistive Memory

Stefano Ambrogio(IBM (United States)), Daniele Ielmini(Politecnico di Milano), Simone Balatti, Seol Choi(Politecnico di Milano)
Advanced Materials
March 26, 2014
10.1002/adma.201306250
Cited by 111

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