The characterization of Cr secondary oxide phases in ZnO films studied by X-ray spectroscopy and photoemission spectroscopy
J. W. Chiou(National University of Kaohsiung), Jing Guo(University of Science and Technology of China), Chin-Wei Hsu(National Tsing Hua University), Sin-Yuen Chang(National University of Kaohsiung), C.-H. Chen(National Synchrotron Radiation Research Center), Y.T. Chen(National University of Kaohsiung), Krishna Kumar(University of Waterloo), Y. M. Hu(National University of Kaohsiung), W.H. Huang(National University of Kaohsiung), J.M. Chen(National Synchrotron Radiation Research Center)
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