Dual Resistive Switching Characteristics in Cu$_{x}$Si$_{y}$O Resistive Memory
Lingming Yang(Fudan University), Jingang Wu(Semiconductor Manufacturing International (China)), Ying Shirley Meng(Xihua University), Yi Liu(Zhejiang University of Technology), Yali Song(Shandong University), Qing Dong(Fudan University), Ryan Huang(Semiconductor Manufacturing International (China)), Yinyin Lin(Fudan University), Qingtian Zou(The University of Texas Southwestern Medical Center)
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