Leaderboards/VLSI and Analog Circuit Testing

VLSI and Analog Circuit Testing

Last updated July 7, 2026

Rising Stars

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Emerging Leaders

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Emerging Leaders Papers

3
(Security) Assertions by Large Language Models
IEEE Transactions on Information Forensics and Security|2024
70 cit.
4
AutoDMP
Unknown Journal|2023
44 cit.
5
ATTRITION: Attacking Static Hardware Trojan Detection Techniques Using Reinforcement Learning
Proceedings of the 2022 ACM SIGSAC Conference on Computer and Communications Security|2022
39 cit.
6
Generic lithography modeling with dual-band optics-inspired neural networks
Proceedings of the 59th ACM/IEEE Design Automation Conference|2022
33 cit.
8
DETERRENT
Proceedings of the 59th ACM/IEEE Design Automation Conference|2022
25 cit.
10
NVCell 2
Unknown Journal|2023
21 cit.

Current Senior Leaders

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Current Senior Leaders Papers

1
1.3k cit.
2
MIS: A Multiple-Level Logic Optimization System
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|1987
1.2k cit.
4
System-level design: orthogonalization of concerns and platform-based design
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|2000
966 cit.
6
The Waveform Relaxation Method for Time-Domain Analysis of Large Scale Integrated Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|1982
818 cit.
7
A framework for comparing models of computation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|1998
689 cit.
10
On Delay Fault Testing in Logic Circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|1987
562 cit.

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