Effect of the Bottom Electrode Contact (BEC) on the phase transformation of N<sub>2</sub> doped Ge<sub>2</sub>Sb<sub>2</sub>Te <sub>5</sub> (N-GST) in a Phase-change Random Access MemoryKinam Kim, Y.N. Hwang, S. H. Lee et al.|MRS Proceedings|2004Cited by 6