W.P. Kang, Jianbin Xu, Q. Li et al.|Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena|1996
William F. Paxton, J. L. Davidson, W.P. Kang et al.|Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena|2012