Impact of HfO<sub>2</sub> Dielectric Layer Placement in Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub>‐Based Ferroelectric Tunnel Junctions for Neuromorphic ApplicationsJ. Kim, Sungjun Kim, Yongjin Park et al.|Advanced Materials Technologies|2024Cited by 39