The effects of ion gun beam voltage on the electrical characteristics of NbCN/PbBi edge junctionsArthur W. Lichtenberger, E. J. Cukauskas, M. J. Feldman et al.|IEEE Transactions on Magnetics|1989Cited by 4
Fabrication of NbCN/PbBi edge junctions with extremely low leakage currentsR.S. Amos, E. J. Cukauskas, M. J. Feldman et al.|IEEE Transactions on Magnetics|1991Cited by 3