Measurement of electrical properties of materials under the oxide layer by microwave-AFM probeLan Zhang, Akifumi Fujimoto, Yang Ju et al.|Microsystem Technologies|2012Cited by 7
Microwave atomic force microscope: MG63 osteoblast-like cells analysis on nanometer scaleLan Zhang, Yang Ju, Yuanhui Song et al.|Microsystem Technologies|2015Cited by 4
Microwave atomic force microscope: MG63 osteoblast-like cells analysis on nanometer scaleLan Zhang, Yang Ju, Yuanhui Song et al.|Unknown|2014Cited by 1
Enhancement of Sensitivity for the Evaluation of Electrical Properties by Modifying the Nano Structure of Microwave AFM ProbeLan Zhang, Akifumi Fujimoto, Atsushi HOSOI et al.|Materials science forum|2011Cited by 0