Wireless wafer-level testing of integrated circuits via capacitively-coupled channelsDae‐Young Lee, John P. Hayes, David D. Wentzloff|Unknown|2011Cited by 7
A 900 Mbps single-channel capacitive I/O link for wireless wafer-level testing of integrated circuitsDae‐Young Lee, John P. Hayes, David D. Wentzloff|Unknown|2011Cited by 3
Wireless wafer probing for on-chip analog voltage measurementDae‐Young Lee, John P. Hayes, David D. Wentzloff|Unknown|2012Cited by 0