Metric Learning for Multi-Output TasksWeiwei Liu, Wenjie Zhang, Donna Xu et al.|IEEE Transactions on Pattern Analysis and Machine Intelligence|2018Cited by 113
Large Margin Metric Learning for Multi-Label PredictionWeiwei Liu, Ivor W. Tsang|Proceedings of the AAAI Conference on Artificial Intelligence|2015Cited by 91
Multilabel Prediction via Cross-View SearchXiaobo Shen, Yew-Soon Ong, Quansen Sun et al.|IEEE Transactions on Neural Networks and Learning Systems|2017Cited by 71
Compressed K-Means for Large-Scale ClusteringXiaobo Shen, Quansen Sun, Fumin Shen et al.|Proceedings of the AAAI Conference on Artificial Intelligence|2017Cited by 70
On the optimality of classifier chain for multi-label classificationWeiwei Liu, Ivor W. Tsang|UTS ePRESS (University of Technology Sydney)|2015Cited by 59