R

R. Joerger

Uppsala University

Publishes on Surface Roughness and Optical Measurements, Optical Polarization and Ellipsometry, nanoparticles nucleation surface interactions. 20 papers and 2.6k citations.

20Publications
2.6kTotal Citations

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Top publicationsby citations

Silver-based crystalline nanoparticles, microbially fabricated
T. Klaus, R. Joerger, Eva Olsson et al.|Proceedings of the National Academy of Sciences|1999
Cited by 1.4kOpen Access

One mechanism of silver resistance in microorganisms is accumulation of the metal ions in the cell. Here, we report on the phenomenon of biosynthesis of silver-based single crystals with well-defined compositions and shapes, such as equilateral triangles and hexagons, in Pseudomonas stutzeri AG259. The crystals were up to 200 nm in size and were often located at the cell poles. Transmission electron microscopy, quantitative energy-dispersive x-ray analysis, and electron diffraction established that the crystals comprise at least three different types, found both in whole cells and thin sections. These Ag-containing crystals are embedded in the organic matrix of the bacteria. Their possible potential as organic-metal composites in thin film and surface coating technology is discussed.

Biologically Produced Silver-Carbon Composite Materials for Optically Functional Thin-Film Coatings
R. Joerger, T. Klaus, C. G. Granqvist|Advanced Materials|2000
Cited by 360

Metal-containing bacteria as precursors for thin films is the concept behind the production of these ceramic–metal composites (cermets) that consist of an organic carbon matrix with embedded crystalline metallic silver particles of various morphologies and sizes (see Figure). It is demonstrated that the optical properties of the films can be tailored by adjustment of temperature and metal volume fraction.

Influence of incoherent superposition of light on ellipsometric coefficients
R. Joerger, K. Forcht, Andreas Gombert et al.|Applied Optics|1997
Cited by 48

Reflections from the back surface of a transparent substrate influence the evaluation of optical constants of thin films from ellipsometric measurements. If the thickness of the substrate is large compared with the coherence length of the light, the relative phase between the p and s mode, which commonly is measured by ellipsometry, cannot be defined properly. We show how the reflections from the back surface of the substrate are taken into account in ellipsometric measurements by calculating the intensities of reflections for arbitrary angles of polarization. Applications of the new method, such as transmittance ellipsometry, ellipsometry at the back surface of the substrate, and the determination of the optical constants at the substrate-layer interface, are compared with measurements.