Aberrations in confocal fluorescence microscopy induced by mismatches in refractive indexStefan W. Hell, Ernst H. K. Stelzer, G. Reiner et al.|Journal of Microscopy|1993Cited by 651
Properties of a 4Pi confocal fluorescence microscopeStefan W. Hell, Ernst H. K. Stelzer|Journal of the Optical Society of America A|1992Cited by 565
Fundamental improvement of resolution with a 4Pi-confocal fluorescence microscope using two-photon excitationStefan W. Hell, Ernst H. K. Stelzer|Optics Communications|1992Cited by 412
Confocal microscopy with an increased detection aperture: type-B 4Pi confocal microscopyStefan W. Hell, Ernst H. K. Stelzer, Steffen Lindek et al.|Optics Letters|1994Cited by 166
Measurement of the 4Pi-confocal point spread function proves 75 nm axial resolutionStefan W. Hell, Ernst H. K. Stelzer, Steffen Lindek et al.|Applied Physics Letters|1994Cited by 151