Measuring Electric Field at Interfaces of Fe2O3 and Cr2O3 via High Resolution S/TEM MethodsDongye Liu, Andrew M. Minor, Matthew Chancey et al.|Microscopy and Microanalysis|2025Cited by 0
Irradiation-induced amplification of electric fields at oxide interfaces as revealed by correlative DPC-STEM and DFTElizabeth A. Peterson, Andrew M. Minor, Dongye Liu et al.|arXiv (Cornell University)|2026Cited by 0
Irradiation-induced amplification of electric fields at oxide interfaces as revealed by correlative DPC-STEM and DFTElizabeth A. Peterson, Andrew M. Minor, Dongye Liu et al.|arXiv (Cornell University)|2026Cited by 0
Asymmetric defect transport across interfaces in heterostructures of Fe <sub>2</sub> O <sub>3</sub> and Cr <sub>2</sub> O <sub>3</sub> under ion irradiationTiffany C. Kaspar, Andrew M. Minor, Yongqiang Wang et al.|Materials Advances|2026Cited by 0
Revealing the Atomistic and Electronic Structure of Irradiated Oxide Interfaces via DFT and 4D-STEM DPCSean H. Mills, Blas P. Uberuaga, Elizabeth A. Peterson et al.|Microscopy and Microanalysis|2026Cited by 0